Offer fully automated multi-technique analysis along with high throughput without sacrificing research grade results with the Thermo Scientific Nexsa XPS System. Integration of multiple analytical techniques like ISS, UPS, REELS and Raman allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra-thin films, nanotechnology development and many other applications.

Product Features

  • Insulator Analysis
  • High Performance Spectroscopy
  • Depth Profiling
  • Multi-technique Integration
  • Dual-mode ion source for expanded depth profiling capabilities
  • Tilt Module for ARXPS measurements
  • Avantage Software for for instrument control, data processing, and reporting
  • Small spot analysis


  • Glass coatings
  • Polymers
  • Batteries
  • Graphene
  • Solar cells
  • OLEDs
  • Metals & oxides
  • Bio-surfaces
  • Thin Films
  • Semiconductors
  • Ceramics
  • Catalysts
  • Nanomaterials

Optional Upgrades

  • RAMAN: Spectroscopic technique used to in chemistry to provide a structural fingerprint
  • ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
  • UPS: Ultra-violet photoelectron spectroscopy refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region
  • REELS: Reflected electron energy loss spectroscopy provides information on electronic structure and can measure the presence of hydrogen