Transmission Electron Microscopy (TEM) Services – JEOL JEM-2100F

The JEM-2100F is an advanced Field Emission Electron Microscope featuring ultrahigh resolution 200 KV analytical TEM.

System Capabilities and Specifications

Our Single Beam and Dual Beam FEI FIB can provide both internal and external lift out capabilities, 200 kV with 0.5nm probe size and EDS and EELS Analysis.